Scientists spy on the first stages of crystal growth

A new microscopy technique has allowed researchers to make the first measurements of the earliest stages of crystallization. The technique could help scientists to gain a more complete understanding of how materials crystallize - which might eventually lead to high-speed computer memories based on crystallization. Dr. Bong-Sub Lee, Prof. John Abelson (MatSE), and Prof. Stephen Bishop (ECE) conveyed the work in collaboration with IBM Almaden Research Center.