Electron Microscopy

Oral Qualifying Exam - Electron Microscopy

 

NON-EXHAUSTIVE TOPICAL AREAS 

• Construction of the electron microscope (Electron sources, lenses, apertures, stages, detectors, aberration correctors, image filters) 
• Scattering Processes (Elastic and inelastic processes) 
• Diffraction (reciprocal space, diffracted beams, diffraction patterns, Kikuchi lines and Maps, CBED) 
• Imaging (wave optics, kinematical theory of image formation, dynamical theory of image formation, Two-beam bright and dark field images, weak-beam dark field images, Phase contrast imaging) 
• Spectroscopy (X-ray microanalysis, Electron energy loss spectroscopy) 
  
  

LEVEL (BASED ON UIUC COURSES) 

• MSE 481 and 598 EM 
  
  

TEXTBOOKS

• D. B. Williams and C. B. Carter "Transmission electron microscopy", Plenum 
• P.B. Hirsch, A. Howie, R.B. Nicholson, D. W. Pashley and M. J. Whelan "Electron Microscopy of Thin Crystals" Krieger. 
• J. W. Edington "Practical Electron Microscopy in Materials Science" Van Nostrand, New York. 
• L. Reimer Transmission Electron Microscopy. Springer-Verlag. 
• B. Fultz and J.M. Howe, Transmission Electron Microscopy and Diffractometry of Materials, Springer