Ivan Racheff Professor of Materials Science and Engineering Jian-Min Zuo was recently elected Fellow of the Microscopy Society of America (MSA) in the Class of 2018.
MSA Fellows are intended to recognize senior distinguished members of the Society who have made significant contributions to the advancement of the field of microscopy and microanalysis through a combination of scientific achievement and service to the scientific community and MSA.
Zuo was nominated for “being an expert in electron diffraction and making essential contributions to theory of electron dynamic diffraction, especially theory and techniques of electron nanodiffraction for nanostructure analysis.”
Learn more about Professor Zuo’s group and research.